XPLOR 100 (bubbles & inclusions)The perfect blend of innovative design and state of the art technology
XPLOR 100
XPLOR 100 is a state of the art, fully automated metrology device designed for measurement and analysis of bubbles and inclusions for optical substrates in the Visible and NIR wave-bands.
SYSTEM SPECS |
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|---|---|---|---|---|---|
| SPECIFICATION | DESIGN VALUE | ||||
| XYZ Positioning Accuracy | +/- 0.001mm | ||||
| Camera Resolution | 1280 X 1024 | ||||
| Pixel Size | 5.3um X 5.3um | ||||
| Measurement Area | 100mm X 100mm X 100mm | ||||
| Bit Depth | 10 Bits | ||||
| Frame Rate | 60 fps | ||||
| Light Source | SiN3 | ||||
| Wavelength Range | 400nm to 1000nm | ||||
| LENS OPTIONS | |||||
| MAGNIFICATION | 0.243X | 0.528X | 1.00X | 2.00X | |
| Working Distance | 103 mm | 44 mm | 62.2 mm | 55.9 mm | |
| Depth of Field | ±11 mm | ±1 mm | ±11 mm | ±0.3 mm | |
| Field of View | 45.2 mm | 20.8 mm | 11 mm | 5.5 mm | |
| MAINFRAME | |||||
| Envelope Dimensions (LWH) | 438mm x 518mm x 662mm | ||||
| Electrical Requirements | 120 VAC, 60 Hz | ||||
| Weight | 70lbs (Mainframe) | ||||